Surface roughness and electrical resistance on Si(1 0 0)2 × 3-Na surface

Surface Science

Volumn 493, Issue 1-3, 2001, Pages 619-625

  Ryjkov, S V ^a,b,c,d   Nagao, T ^c,d   Lifshits, V G ^a,b   Hasegawa, S ^c,d  

^a INSTITUTE OF AUTOMATION AND CONTROL PROCESSES   (Russian Federation)

^b FAR EASTERN FEDERAL UNIVERSITY   (Russian Federation)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

Author keywords

Alkali metals; Atom solid interactions; Silicon; Surface electrical transport (surface conductivity, surface recombination, etc.); Surface structure, morphology, roughness, and topography

Indexed keywords

ALKALI METALS; DEPOSITION; ELECTRIC RESISTANCE; MONOLAYERS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SCATTERING; SURFACE ROUGHNESS; TRANSPORT PROPERTIES;

CARRIER SCATTERING;

SEMICONDUCTING SILICON;

EID: 0035500894     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01274-2     Document Type: Conference Paper

References (14)