Growth, morphology, and microindentation analysis of Bi2Se3, Bi1.8In0.2Se3, and Bi2Se2.8Te0.2 single crystals

Materials Research Bulletin

Volumn 36, Issue 13-14, 2001, Pages 2251-2261

  Augustine, Saji ^a   Mathai, Elizabeth ^a  

^a Department of Physics   (India)

Author keywords

A. Semiconductor; B. Crystal growth; D. Defects; D. Mechanical properties

Indexed keywords

ANNEALING; BISMUTH COMPOUNDS; CRYSTAL GROWTH; FREEZING; LATTICE CONSTANTS; MICROHARDNESS; MORPHOLOGY; QUENCHING; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

X-RAY DIFFRACTOGRAM;

SINGLE CRYSTALS;

EID: 0035499725     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(01)00717-6     Document Type: Article

References (18)

1. Sensors 89, technologies and applications
2. The science of hardness testing and its research applications