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Volumn 184, Issue 3, 2001, Pages 450-457

Electron probe microanalysis inverse modeling

Author keywords

Electron probe microanalysis; Inverse modeling; Monte Carlo; Simulated annealing

Indexed keywords

ANNEALING; MICROANALYSIS; MONTE CARLO METHODS; PARTICLE SIZE ANALYSIS; X RAY ANALYSIS;

EID: 0035498703     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00773-X     Document Type: Article
Times cited : (5)

References (19)
  • 4
    • 0002637710 scopus 로고    scopus 로고
    • Ph.D. Thesis, Institut für Allgemeine Physik, Technical University of Vienna, Austria
    • (1999)
    • Wagner, H.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.