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Volumn 184, Issue 3, 2001, Pages 450-457
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Electron probe microanalysis inverse modeling
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Author keywords
Electron probe microanalysis; Inverse modeling; Monte Carlo; Simulated annealing
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Indexed keywords
ANNEALING;
MICROANALYSIS;
MONTE CARLO METHODS;
PARTICLE SIZE ANALYSIS;
X RAY ANALYSIS;
ELECTRON PROBE MICROANALYSIS;
ELECTRON DEVICES;
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EID: 0035498703
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(01)00773-X Document Type: Article |
Times cited : (5)
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References (19)
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