The application of scanning X-ray fluorescence microanalysis in the examination of cultural materials

Archaeometry

Volumn 43, Issue 4, 2001, Pages 475-482

  Scott, D A ^a  

^a GETTY CONSERVATION INSTITUTE   (United States)

Author keywords

Elemental Mapping; Inorganic analysis; Non destructive analysis; Omicron; Pigments; Scanning X ray fluorescence Analysis

Indexed keywords

EID: 0035498156     PISSN: 0003813X     EISSN: None     Source Type: Journal    
DOI: 10.1111/1475-4754.00030     Document Type: Article

References (10)

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