Identification of planar defects in D019 phases using high-resolution transmission electron microscopy

Philosophical Magazine Letters

Volumn 81, Issue 10, 2001, Pages 697-707

  Carvalho, P ^a   Kooi, B J ^a   De Hosson, J Th M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL STRUCTURE; CRYSTAL SYMMETRY; DUCTILITY; IMAGE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);

CRYSTAL DEFECTS;

EID: 0035494773     PISSN: 09500839     EISSN: None     Source Type: Journal    
DOI: 10.1080/09500830110071726     Document Type: Article

References (24)

1. High-temperature ordered intermetallic alloys VI
2. High-temperature ordered intermetallic alloys VII