Novel pretilt angle measurement method for twisted-nematic liquid-crystal cells by apparent retardation measurement

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 10, 2001, Pages 6017-6023

  Nishioka, T ^a   Kurata, T ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

Apparent retardation; Jones matrix; Liquid crystal display; Pretilt angle; Twisted nematic

Indexed keywords

COMPUTER SIMULATION; ELLIPSOMETRY; MATRIX ALGEBRA; REFRACTIVE INDEX; SECOND HARMONIC GENERATION;

APPARENT RETARDATION MEASUREMENT; JONES MATRIX; PRETILT ANGLE; TWISTED NEMATIC;

LIQUID CRYSTAL DISPLAYS;

EID: 0035484808     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.6017     Document Type: Article

References (8)