Results of radiation test of the cathode front-end board for CMS endcap muon chambers

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 471, Issue 3, 2001, Pages 340-347

  Breedon, R ^a   Bylsma, B ^b   Durkin, L S ^b   Gilmore, J ^b   Gu, J ^b   Hauser, J ^c   Holbrook, B ^a   Kim, C L ^b   Ling, T Y ^b   Von Der Mey, M ^c   Murray, P ^a   Rush, C J ^b   Santiard, J C ^d   Tripathi, M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b OHIO STATE UNIVERSITY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d CERN   (Switzerland)

Author keywords

Radiation tolerance of CMS electronics

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; IONIZATION; NEUTRONS; PROTON IRRADIATION; PROTONS;

CATHODE FRONT-END BOARDS;

NUCLEAR INSTRUMENTATION;

EID: 0035479162     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00857-9     Document Type: Article

References (3)