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Journal of Electron Spectroscopy and Related Phenomena

Volumn 120, Issue 1-3, 2001, Pages 67-76

Line shape and lifetime in argon 2p electron spectroscopy

(6) Carroll, T X a Bozek, J D b Kukk, E c Myrseth, V d Saethre L J d Thomas, T D e

a KEUKA COLLEGE (United States)

b UNIVERSITY OF CALIFORNIA (United States)

c UNIVERSITY OF OULU (Finland)

d UNIVERSITY OF BERGEN (Norway)

e OREGON STATE UNIVERSITY (United States)

Author keywords

Auger; Lifetime; Linewidth; Photoelectron; Post collision interaction

Indexed keywords

CARBON DIOXIDE; ELECTRON ENERGY LEVELS; ELECTRON TRANSITIONS; KINETIC ENERGY; PHOTOELECTRON SPECTROSCOPY;

POST-COLLISION INTERACTIONS;

ARGON;

EID: 0035477994 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/S0368-2048(01)00306-1 Document Type: Article

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.