Implementation and comparative evaluation of various architectures of ultrasonic photorefractive sensors

Optical Materials

Volumn 18, Issue 1, 2001, Pages 45-48

  De Rossi, S ^a   Delaye, Ph ^a   Launay, J C ^b   Roosen, G ^a  

^a CNRS   (France)

^b INST CHIM MATIERE COND BORDEAUX   (France)

Author keywords

Photorefractive effect; Screening field; Ultrasonic detection

Indexed keywords

ANISOTROPY; BANDWIDTH; CONTINUOUS WAVE LASERS; CRYSTALS; DIFFRACTION; ELECTRIC FIELD EFFECTS; HOLOGRAPHY; PHOTOREFRACTIVE MATERIALS; SPECKLE; ULTRASONIC DEVICES;

ULTRASONIC DETECTION SYSTEMS;

OPTICAL SENSORS;

EID: 0035477540     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-3467(01)00128-8     Document Type: Article

References (5)