Carrier lifetime measurement on electroluminescent metal-oxide-silicon tunneling diodes

Applied Physics Letters

Volumn 79, Issue 14, 2001, Pages 2264-2266

  Chen, Miin Jang ^a   Lin, Ching Fuh ^a   Lee, M H ^a   Chang, S T ^a   Liu, C W ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035475479     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1405429     Document Type: Article

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