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Volumn 79, Issue 14, 2001, Pages 2231-2233
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Estimation of the dielectric properties of low-k materials using optical spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035473548
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1408607 Document Type: Article |
Times cited : (21)
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References (16)
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