Characterization of room-temperature plastic deformation of β-Si3N4 by atomic force microscopy and transmission electron microscopy

Philosophical Magazine Letters

Volumn 81, Issue 9, 2001, Pages 623-629

  Milhet, X ^a   Girard, J C ^a   Demenet, J L ^a   Rabier, J ^a  

^a ENSMA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DISLOCATIONS (CRYSTALS); MICROHARDNESS; MICROSTRUCTURE; PLASTIC DEFORMATION; SURFACE CHEMISTRY; TRANSMISSION ELECTRON MICROSCOPY;

CROSS-SLIP EVENTS;

SILICON NITRIDE;

EID: 0035467468     PISSN: 09500839     EISSN: None     Source Type: Journal    
DOI: 10.1080/0950083011068612     Document Type: Article

References (18)