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Volumn , Issue 459, 2001, Pages 263-266
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Studies of X-ray source variability using RXTE-ASM
a a a a |
Author keywords
X rays: binaries
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Indexed keywords
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EID: 0035465545
PISSN: 03796566
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (27)
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