In-process measurement of ELID grinding status: Thickness of insulating layer

KSME International Journal

Volumn 15, Issue 9, 2001, Pages 1268-1273

  Kim, Hwa Young ^a   Ahn, Jung Hwan ^a   Seo, Young Ho ^a   Paik, In Hwan ^a  

^a Pusan National University   (South Korea)

Author keywords

Capacitance gap sensor; Eddy current gap sensor; ELID grinding; In process measurement; Insulating layer thickness

Indexed keywords

EID: 0035457956     PISSN: 12264865     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF03185667     Document Type: Article

References (5)

1. Ohmori, H. and Nakagawa, T., 1995, "Analysis of Mirror Surface Generation of Hard and Brittle Material by ELID Grinding with Superfine Grain Metallic Bond Wheels," Annals of the CIRP, Vol. 44. pp. 287-290.
2. Kim, H. Y. and Ohmori, H., 1997, "Development of Mirror Surface Slicing Machine Installed with Grinding System Using Metallic Bond Diamond Blades and ELID," Proceedings of the 8th ICPE, pp. 252-262.
3. Ohmori, H. and Takahashi, I., 1994, "Efficient Grinding Technique Utilizing ELID for Precision Machining of Hard Materials," Advancement of Intelligent Production, JSPE, pp. 315-320.
4. Ohmori, H., 1993, "Electrolytic In-Process Diessing(ELID) Grinding Technique for Ultraprecision Mirror Surface Machine," J. of JSPE, Vol. 59, No. 9, pp. 1451-1457. (in Japanese)
5. Eung-Sug Lee, Tae-Jin Je and Hitoshi Ohmori, 2000, "Development of Cylindrical Grinding Technology with Electrolytic In-Process Dressing Method," International Journal of KSPE, Vol. 1, No 1, pp. 127-132.