Accurate measurement of defect edge by the active contour models

Nongye Gongcheng Xuebao/Transactions of the Chinese Society of Agricultural Engineering

Volumn 17, Issue 5, 2001, Pages 159-

  He, D J ^a   Geng, N ^a   Dang, G R ^a   Long, M S ^a   Ning, J F ^a  

^a NONE

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EID: 0035456515     PISSN: 10026819     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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