A method for the prediction of microwave properties of thick film conductors from physical measurements and d.c. conductivity

Journal of Materials Science: Materials in Electronics

Volumn 12, Issue 9, 2001, Pages 491-495

  Pitt, K ^a   Free, C ^a   Tian, Z ^a   Jakubowska, M ^b  

^a MIDDLESEX UNIVERSITY   (United Kingdom)

^b Department of Micro and Nanotechnology of Wide Bandgap Semiconductors   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTORS; ELECTRIC LOSSES; ELECTRIC RESISTANCE; MICROWAVES; SURFACE ROUGHNESS;

MICROSTRIP EQUATIONS;

THICK FILM DEVICES;

EID: 0035455082     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1012441223927     Document Type: Article

References (6)

1. Microwave theory