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Volumn 137, Issue 1-4, 2001, Pages 33-41
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An intelligent simulation methodology to characterize defects in materials
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Author keywords
Defect classification; Material characterization and testing; Neural networks; Nondestructive testing; Wavelet transform
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Indexed keywords
ARTIFICIAL INTELLIGENCE;
COMPUTER SIMULATION;
FEATURE EXTRACTION;
NEURAL NETWORKS;
NONDESTRUCTIVE EXAMINATION;
WAVELET TRANSFORMS;
PRE-CLUSTERING METHOD;
PATTERN MATCHING;
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EID: 0035452691
PISSN: 00200255
EISSN: None
Source Type: Journal
DOI: 10.1016/S0020-0255(01)00112-8 Document Type: Article |
Times cited : (24)
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References (17)
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