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Volumn 137, Issue 1-4, 2001, Pages 33-41

An intelligent simulation methodology to characterize defects in materials

Author keywords

Defect classification; Material characterization and testing; Neural networks; Nondestructive testing; Wavelet transform

Indexed keywords

ARTIFICIAL INTELLIGENCE; COMPUTER SIMULATION; FEATURE EXTRACTION; NEURAL NETWORKS; NONDESTRUCTIVE EXAMINATION; WAVELET TRANSFORMS;

EID: 0035452691     PISSN: 00200255     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0020-0255(01)00112-8     Document Type: Article
Times cited : (24)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.