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Volumn 179, Issue 4, 2001, Pages 543-550

Track etch parameters in CR-39 detectors for proton and alpha particles of different energies

Author keywords

Bragg peak; Bulk etch rate; Critical angle of incidence; Poly allyl diglycol carbonate (CR 39); Restricted energy loss; Track etch rate

Indexed keywords

ALPHA PARTICLES; ENERGY DISSIPATION; ETCHING; PROTONS;

EID: 0035449662     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00601-2     Document Type: Article
Times cited : (35)

References (17)
  • 14
    • 0003749398 scopus 로고
    • US Naval Radiological Defence Laboratory, Report USNRDL-TR-1102, San Francisco
    • (1968)
    • Henke, R.P.1    Benton, E.V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.