Interlayer electrodynamics of Bi2Sr2CaCu2Oy from the c-axis complex dielectric constant measurements

Physica C: Superconductivity and its Applications

Volumn 362, Issue 1-4, 2001, Pages 247-250

  Kitano, H ^a   Kinoshita, K ^a   Iwaya, K ^a   Abiru, R ^a   Maeda, A ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Bi2Sr2CaCu2Oy; c axis; Conductivity; Interlayer; Penetration depth

Indexed keywords

BISMUTH COMPOUNDS; CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; HOLE MOBILITY; PERMITTIVITY MEASUREMENT; SEMICONDUCTOR DOPING;

INTERLAYER ELECTRODYNAMICS;

ELECTRODYNAMICS;

EID: 0035448338     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(01)00680-3     Document Type: Article

References (11)