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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 179, Issue 4, 2001, Pages 515-520

A novel method to determine the ion sputter coefficient of dilute segregating impurities

(3) Viljoen, E C a,c Taglauer, E b Du Plessis, J a

a UNIVERSITY OF THE FREE STATE (South Africa)

b MAX PLANCK INSTITUT FÜR PLASMAPHYSIK (Germany)

c NATIONAL ACCELERATOR CENTRE (South Africa)

Author keywords

Auger electron spectroscopy; Ion beam interaction with surfaces; Ion sputter coefficient; Surface segregation

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; HEATING; IMPURITIES; LINEAR PROGRAMMING; METALLIC FILMS; MONOLAYERS; SPUTTERING; THIN FILMS;

SURFACE SEGREGATION;

ION BEAMS;

EID: 0035448059 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/S0168-583X(01)00685-1 Document Type: Article

Times cited : (2)

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