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Volumn 144, Issue 1-2, 2001, Pages 123-132

Thermoelectric properties and defect structure of La0.45Nd0.45Sr0.1FeO3-δ

(4) Kobayashi, Kiyoshi a Yamaguchi, Shu b Tsunoda, Tatsuo a Imai, Yoji a

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

b NAGOYA INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

Defect model; Electrical conductivity; Heat of transport of holes; Hole concentration; LaFeO3; Mobility; NdFeO3; Seebeck coefficnt; Thermal conductivity

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; DEFECTS; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; OXIDES; SEEBECK EFFECT; SOLID SOLUTIONS; THERMAL CONDUCTIVITY; TRANSPORT PROPERTIES;

THERMOELECTRIC PROPERTIES;

LANTHANUM COMPOUNDS;

EID: 0035446673 PISSN: 01672738 EISSN: None Source Type: Journal
DOI: 10.1016/S0167-2738(01)00890-6 Document Type: Article

Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.