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Volumn 64, Issue 10, 2001, Pages 1042011-1042015

Analysis of the moving photocarrier grating technique for semiconductors of high defect density

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DENSITY; DIFFUSION; ELECTRIC FIELD; ELECTRON; GRATING; LIGHT; PHOTODEGRADATION; SEMICONDUCTOR; SHORT CIRCUIT CURRENT; SURFACE CHARGE; TECHNIQUE;

EID: 0035445215     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/physrevb.64.104201     Document Type: Article
Times cited : (5)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.