The Al-Si-C phase diagram and its use for microstructural analysis of MMCp and MMCf composite materials

Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 92, Issue 9, 2001, Pages 1103-1110

  Aksenov, A A ^a   Belov, N A ^a   Medvedeva, S V ^a  

^a NATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY MISIS   (Russian Federation)

Author keywords

Al Si C phase diagram; Composite materials; MMCf; MMCp

Indexed keywords

DIFFRACTOMETERS; METALLIC MATRIX COMPOSITES; METALLOGRAPHIC MICROSTRUCTURE; MICROANALYSIS; OPTICAL MICROSCOPY; PHASE COMPOSITION; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; SPECTROMETERS; X RAY DIFFRACTION ANALYSIS;

ELECTRON PROBE MICROANALYSIS; FOUR-CRYSTAL SPECTROMETER; POLYTHERMAL SECTIONS;

PHASE DIAGRAMS;

EID: 0035444115     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)