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Volumn 19, Issue 5, 2001, Pages 2315-2319

Defect characterization of silver-based low-emissivity multilayer coatings for energy-saving applications

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CLEANING; DEPOSITION; ENERGY CONSERVATION; ENERGY DISPERSIVE SPECTROSCOPY; GLASS; MULTILAYERS; OPACITY; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SILVER; SPUTTERING; SUBSTRATES;

EID: 0035441623     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1384562     Document Type: Article
Times cited : (5)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.