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Volumn 19, Issue 5, 2001, Pages 2315-2319
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Defect characterization of silver-based low-emissivity multilayer coatings for energy-saving applications
a,b b a,b |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
CLEANING;
DEPOSITION;
ENERGY CONSERVATION;
ENERGY DISPERSIVE SPECTROSCOPY;
GLASS;
MULTILAYERS;
OPACITY;
OPTICAL MICROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SILVER;
SPUTTERING;
SUBSTRATES;
LOW-EMISSIVITY MULTILAYER COATINGS;
OPTICAL COATINGS;
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EID: 0035441623
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1384562 Document Type: Article |
Times cited : (5)
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References (9)
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