|
Volumn 37, Issue 5 I, 2001, Pages 3375-3379
|
Self-consistent simulations of transient heating effects in electrical devices using the finite integration technique
a a a a |
Author keywords
AlGaAs GaAs HBT; Eddy current heating; Electro thermal coupling; FIT
|
Indexed keywords
FINITE ELEMENT METHOD;
HETEROJUNCTION BIPOLAR TRANSISTORS;
INDUCTION HEATING;
INTEGRATION;
THERMAL EFFECTS;
ELECTRICAL DEVICES;
ELECTRO-THERMAL COUPLING;
FINITE INTEGRATION;
TRANSIENT HEATING EFFECTS;
ELECTRIC EQUIPMENT;
|
EID: 0035440694
PISSN: 00189464
EISSN: None
Source Type: Journal
DOI: 10.1109/20.952617 Document Type: Article |
Times cited : (18)
|
References (14)
|