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Volumn 37, Issue 5 I, 2001, Pages 3375-3379

Self-consistent simulations of transient heating effects in electrical devices using the finite integration technique

Author keywords

AlGaAs GaAs HBT; Eddy current heating; Electro thermal coupling; FIT

Indexed keywords

FINITE ELEMENT METHOD; HETEROJUNCTION BIPOLAR TRANSISTORS; INDUCTION HEATING; INTEGRATION; THERMAL EFFECTS;

EID: 0035440694     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.952617     Document Type: Article
Times cited : (18)

References (14)
  • 8
    • 0003859194 scopus 로고    scopus 로고
    • Zur numerischen Berechnung gekoppelter elektromagnetischer and thermischer Felder
    • Ph.D. dissertation, Darmstadt
    • (1998)
    • Pinder, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.