SCOPUS 정보 검색 플랫폼

Volumn 24, Issue 3, 2001, Pages 399-407

Characteristics of films developed in fretting experiments on tin plated contacts

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT RESISTANCE; FRETTING CYCLES; FRETTING DEGRADATION; SEMICONDUCTOR PROPERTIES;

ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; FRETTING CORROSION; SEMICONDUCTING TIN COMPOUNDS; VOLUME FRACTION;

SEMICONDUCTING FILMS;

EID: 0035440299 PISSN: 15213331 EISSN: None Source Type: Journal
DOI: 10.1109/6144.946486 Document Type: Article

Times cited : (33)

References (7)

1
- 67249123797
- Time distribution of intermittent versus contact resistance for tin-tin connector interfaces during low amplitude motion
- Mar.
- (1984) IEEE Trans. Comp., Hybrids, Manufact. Technol. , vol.7 CHMT , pp. 107-111
- Abbott, W.H.¹

2
- 0031337550
- Intermittence detection in fretting corrosion studies of electrical contacts
- Proc. 43rd IEEE Holm Conf. Electrical Contacts, 1997 , pp. 1-6
- Murrell, S.R.¹ McCarthy, S.L.²

3
- 0033343707
- Contact fretting of electronic connectors
- Jan.
- (1999) Trans. IEICE , pp. 3-12
- Antler, M.¹

4
- 0029770778
- Impact of fretting parameters on contact degradation
- Proc. 42nd IEEE Holm Conf. Electrical Contacts, 1996 , pp. 395-403
- Malucci, R.¹

5
- 0344357692
- Structure and electrical properties of granular films
- (1975) Phys. Rev. , pp. 407-461
- Abeles, B.¹ Sheng, P.² Couts, M.D.³ Arie, Y.⁴

6
- 33749560184
- Percolation and conduction
- (1973) Rev. Mod. Phys. , vol.45 , pp. 574-588
- Kirkpatrick, S.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.