Ray tracing technique and its verification for the analysis of highly multimode optical waveguides with rough surfaces

IEEE Transactions on Magnetics

Volumn 37, Issue 5 I, 2001, Pages 3307-3310

  Bierhoff, Thomas ^a   Wallrabenstein, Amir ^a   Himmler, Andreas ^b   Griese, Elmar ^b   Mrozynski, Gerd ^a  

^a UNIVERSITY OF PADERBORN   (Germany)

^b SIEMENS AG   (Germany)

Author keywords

Electromagnetic scattering by rough surfaces; Geometrical optics; Multimode waveguides; Optical interconnection technology

Indexed keywords

GEOMETRICAL OPTICS; LIGHT POLARIZATION; LIGHT PROPAGATION; MATHEMATICAL MODELS; MONTE CARLO METHODS; OPTICAL WAVEGUIDES; RAY TRACING; SURFACE ROUGHNESS;

COUPLED POWER THEORY; HIGHLY MULTIMODE OPTICAL WAVEGUIDE;

LIGHT SCATTERING;

EID: 0035439785     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.952601     Document Type: Article

References (4)

1. An approach to model wave propagation in highly multimode optical waveguides with rough surfaces
2. Optical interconnections on printed circuit boards
3. Measurement of surface roughness in buried channel waveguides