Curvature estimation in oriented patterns using curvilinear models applied to gradient vector fields

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 23, Issue 9, 2001, Pages 1035-1042

  Van De Weijer, Joost ^b   Van Vliet, Lucas J ^c   Verbeek, Piet W ^c   Van Ginkel, Michael ^a,c  

^a IEEE   (Netherlands)

^b UNIVERSITY OF AMSTERDAM   (Netherlands)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Anisotropy; Confidence measures; Curvature; Curvilinear models; Gradient vector fields; Oriented patterns

Indexed keywords

CURVILINEAR MODELS; GRADIENT VECTOR FIELDS; RESIDUAL ENERGY;

ANISOTROPY; FEATURE EXTRACTION; IMAGE ANALYSIS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; VECTORS;

PATTERN RECOGNITION;

EID: 0035439646     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.955116     Document Type: Article

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