In situ high-temperature X-ray diffraction studies of mixed-conducting perovskite-type oxides

Journal of Materials Science Letters

Volumn 20, Issue 17, 2001, Pages 1631-1633

  Li, S ^a   Xu, N ^a   Shi, J ^a   Hu, M Z C ^b   Payzant, E A ^b  

^a NANJING TECH UNIVERSITY   (China)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATALYSTS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DOPING (ADDITIVES); IONIC CONDUCTION; LATTICE CONSTANTS; OXIDES; REFRACTORY MATERIALS; SINTERING; STOICHIOMETRY; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS;

MIXED-CONDUCTING PEROVSKITES; THERMAL EXPANSION COEFFICIENTS;

PEROVSKITE;

EID: 0035438532     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1017966330832     Document Type: Article

References (15)