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Applied Spectroscopy

Volumn 55, Issue 9, 2001, Pages 1161-1165

Analysis of noise for rapid-scan and step-scan methods of FT-IR difference spectroscopy

(2) Andrews, S S a Boxer, S G a

a STANFORD UNIVERSITY (United States)

Author keywords

Noise analysis; Rapid scan FT IR; Step scan FT IR; Vibrational Stark

Indexed keywords

DEMODULATION; ELECTRIC FIELD EFFECTS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MODULATION; MOLECULAR VIBRATIONS; SIGNAL DETECTION; SIGNAL INTERFERENCE; SPECTRUM ANALYSIS;

RAPID-SCAN METHODS; STEP-SCAN METHODS;

SPURIOUS SIGNAL NOISE;

EID: 0035438471 PISSN: 00037028 EISSN: None Source Type: Journal
DOI: 10.1366/0003702011953414 Document Type: Article

Times cited : (11)

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