SCOPUS 정보 검색 플랫폼

Journal of Materials Research

Volumn 16, Issue 8, 2001, Pages 2189-2191

Transmission electron microscopy observation in a liquid-phase-sintered SiC with oxynitride glass

(5) Zhan, Guo Dong a Mitomo, Mamoru b Kim, Young Wook c Xie, Rong Jun b Mukherjee, Amiya K a

a University of California (United States)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

c University of Seoul (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION; GLASS; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH TEMPERATURE EFFECTS; HOT PRESSING; PHASE TRANSITIONS; PRESSURE EFFECTS; SINTERING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; YTTRIUM;

OXYNITRIDE GLASS;

SILICON CARBIDE;

EID: 0035436248 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2001.0299 Document Type: Article

Times cited : (6)

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