Electronic energy loss of H3+ ion clusters in SiO2 films

Physical Review A. Atomic, Molecular, and Optical Physics

Volumn 64, Issue 2, 2001, Pages

  Behar, M ^a   Dias, J F ^a   Grande, P L ^a   Dos Santos, J H R ^a  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES OF SOLIDS; ELECTRON RESONANCE; IONS; MOLECULAR BEAMS; SILICA; THERMOOXIDATION; THICKNESS MEASUREMENT;

DIELECTRIC FORMALISM; ELECTRONIC ENERGY LOSS; NUCLEAR REACTION ANALYSIS; RESONANCE PEAKS;

QUANTUM THEORY;

EID: 0035435451     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)