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Volumn 180, Issue 1-2, 2001, Pages 162-167
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Microstructural and electrical properties of MgO thin films grown on p-InP (100) substrates at low temperature
a
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Author keywords
Metal insulator semiconductor (MIS); MgO p InP; Transmission electron microscopy (TEM)
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Indexed keywords
CAPACITANCE MEASUREMENT;
CRYSTAL ORIENTATION;
DEPOSITION;
HETEROJUNCTIONS;
MAGNESIA;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR GROWTH;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
VOLTAGE MEASUREMENT;
ELECTRON BEAM DEPOSITION;
METAL INSULATOR BOUNDARIES;
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EID: 0035426814
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(01)00335-X Document Type: Article |
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Times cited : (16)
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References (20)
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