Optical characterization methods for solid-state image sensors

Optics and Lasers in Engineering

Volumn 36, Issue 2, 2001, Pages 185-194

  Willemin, M ^a   Blanc, N ^a   Lang, G K ^a   Lauxtermann, S ^a   Schwider, P ^a   Seitz, P ^a   Wany M ^a  

^a CSEM   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; OPTIMIZATION; PHOTODIODES; SIGNAL TO NOISE RATIO;

ACTIVE PIXEL SENSORS (APS) IMAGERS;

IMAGE SENSORS;

EID: 0035424520     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(01)00035-5     Document Type: Article

References (8)

1. Solid-state image sensing
2. Active pixel sensors APS-are CCDs dinosaurs?