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Volumn 48, Issue 8, 2001, Pages 1492-1497
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Electrical properties and transport mechanisms of InP/InGaAS HBTs operated at low temperature
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Author keywords
Heterojunction bipolar transistors; Indium phosphide; Low temperature; Semiconductor device measurement; Transistors
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Indexed keywords
CARRIER TRANSPORT;
LIQUID HELIUM TEMPERATURE;
SEMICONDUCTOR DEVICE MEASUREMENT;
SHOCKLEY-READ-HALL RECOMBINATION;
ELECTRIC PROPERTIES;
ELECTRON TRANSPORT PROPERTIES;
ELECTRON TUNNELING;
INTEGRATED CIRCUIT LAYOUT;
LOW TEMPERATURE OPERATIONS;
OPTIMIZATION;
SEMICONDUCTING INDIUM GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR DEVICE MODELS;
HETEROJUNCTION BIPOLAR TRANSISTORS;
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EID: 0035424365
PISSN: 00189383
EISSN: None
Source Type: Journal
DOI: 10.1109/16.936496 Document Type: Article |
Times cited : (18)
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References (16)
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