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Volumn 48, Issue 8, 2001, Pages 1492-1497

Electrical properties and transport mechanisms of InP/InGaAS HBTs operated at low temperature

Author keywords

Heterojunction bipolar transistors; Indium phosphide; Low temperature; Semiconductor device measurement; Transistors

Indexed keywords

CARRIER TRANSPORT; LIQUID HELIUM TEMPERATURE; SEMICONDUCTOR DEVICE MEASUREMENT; SHOCKLEY-READ-HALL RECOMBINATION;

EID: 0035424365     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.936496     Document Type: Article
Times cited : (18)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.