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Volumn 110, Issue 4, 2001, Pages 371-385

Straight-sided, buckling-driven delamination of thin films at high stress levels

Author keywords

Buckling driven delamination; Mixed mode interface fracture; Propagating instabilities; Thin films

Indexed keywords

BUCKLING; CRACKS; DELAMINATION; FINITE ELEMENT METHOD; FRACTURE MECHANICS; STRESS INTENSITY FACTORS; STRESSES;

EID: 0035424294     PISSN: 03769429     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1010821918325     Document Type: Article
Times cited : (31)

References (35)
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    • Energy release rates and stability of straight-sided, thin-film delaminations
    • (1993) Acta Materialia , vol.41 , pp. 601-607
    • Jensen, H.M.1
  • 24
    • 0021753973 scopus 로고
    • Stress relief forms of diamond-like carbon thin films under internal compressive stress
    • (1984) Thin Solid Films , vol.112 , pp. 41-49
    • Nir, D.1
  • 33
    • 0032157385 scopus 로고    scopus 로고
    • Measurement and analysis of buckling and buckle propagation in compressed oxide layers on superalloy substrates
    • (1998) Acta Materialia , vol.46 , pp. 4993-5005
    • Wang, J.-S.1    Evans, A.G.2
  • 34
    • 0032757450 scopus 로고    scopus 로고
    • Effects of strain cycling on buckling, cracking and spalling of a thermally grown alumina on a nickel-based bond coat
    • (1999) Acta Materialia , vol.47 , pp. 699-710
    • Wang, J.-S.1    Evans, A.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.