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Volumn 110, Issue 4, 2001, Pages 371-385
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Straight-sided, buckling-driven delamination of thin films at high stress levels
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Author keywords
Buckling driven delamination; Mixed mode interface fracture; Propagating instabilities; Thin films
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Indexed keywords
BUCKLING;
CRACKS;
DELAMINATION;
FINITE ELEMENT METHOD;
FRACTURE MECHANICS;
STRESS INTENSITY FACTORS;
STRESSES;
THIN FILM DELAMINATION;
THIN FILMS;
DELAMINATION;
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EID: 0035424294
PISSN: 03769429
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1010821918325 Document Type: Article |
Times cited : (31)
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References (35)
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