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Volumn 24, Issue 4, 2001, Pages 411-414
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Current-voltage characteristics of Ag, Al, Ni-(n)CdTe junctions
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Author keywords
Photovoltage; Schottky barrier junction; Series resistance
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Indexed keywords
ALUMINUM;
CRYSTAL DEFECTS;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRODES;
NICKEL;
PHOTOVOLTAIC EFFECTS;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTING CADMIUM TELLURIDE;
SEMICONDUCTING FILMS;
SEMICONDUCTOR DOPING;
SILVER;
SPUTTERING;
DIODE IDEALITY FACTOR;
FILL FACTOR;
SCHOTTKY BARRIERS;
SEMICONDUCTOR JUNCTIONS;
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EID: 0035422903
PISSN: 02504707
EISSN: None
Source Type: Journal
DOI: 10.1007/BF02708640 Document Type: Article |
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Times cited : (15)
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References (17)
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