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Volumn 159, Issue 8, 2001, Pages 30-33
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Residual stress measurement techniques
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Author keywords
[No Author keywords available]
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Indexed keywords
BENCHMARKING;
COATINGS;
FAILURE ANALYSIS;
FINITE ELEMENT METHOD;
MATHEMATICAL MODELS;
NEUTRON DIFFRACTION;
POISSON RATIO;
STRAIN GAGES;
STRESS CONCENTRATION;
X RAY DIFFRACTION ANALYSIS;
PHOTO-STRESS COATINGS;
RESIDUAL STRESSES;
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EID: 0035422026
PISSN: 08827958
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (39)
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References (0)
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