SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 32, Issue 1, 2001, Pages 117-120

Interdiffusion coefficients and conductivity in gold/nickel bilayer thin films on silicon(111) wafers

(5) Hadjiivanov, K a Tsyntsarski, B a Ivanova, E a Klissurski, D a Marinova, Ts a

a INSTITUTE OF GENERAL AND INORGANIC CHEMISTRY (Bulgaria)

Author keywords

Gold; Interdiffusion; Nickel; Thin films

Indexed keywords

ANNEALING; CRYSTAL LATTICES; DIFFUSION IN SOLIDS; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; SILICON WAFERS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

SHEET RESISTANCE MEASUREMENTS (SRM);

THIN FILMS;

EID: 0035418929 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1020 Document Type: Conference Paper

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.