Detection of crack propagation in Si3N4/Si3N4-TiN laminated ceramics by electrical resistance

Smart Materials and Structures

Volumn 10, Issue 4, 2001, Pages 846-849

  Zhang, B ^a   Li, J B ^a   Deng, Y ^a   Guan, Z D ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); CRACK PROPAGATION; ELECTRIC RESISTANCE; FRACTURE MECHANICS; FRACTURE TESTING; LAMINATES; STRUCTURAL LOADS;

LAMINATED CERAMICS;

STRUCTURAL CERAMICS;

EID: 0035416839     PISSN: 09641726     EISSN: None     Source Type: Journal    
DOI: 10.1088/0964-1726/10/4/402     Document Type: Article

References (12)