SCOPUS 정보 검색 플랫폼

Microelectronics Reliability

Volumn 41, Issue 8, 2001, Pages 1145-1159

Global fault localization using induced voltage alteration

(1) Cole Jr , Edward I a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTRIC POWER SYSTEMS; ELECTRON BEAMS; INTEGRATED CIRCUITS; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR JUNCTIONS;

CHARGE-INDUCED VOLTAGE ALTERATION (CIVA); LIGHT-INDUCED VOLTAGE ALTERATION (LIVA);

FAILURE ANALYSIS;

EID: 0035416662 PISSN: 00262714 EISSN: None Source Type: Journal
DOI: 10.1016/S0026-2714(01)00103-2 Document Type: Article

Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.