On PD mechanisms at high temperature in voids included in an epoxy resin

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 8, Issue 4, 2001, Pages 3236-3239

  Schifani, R ^a   Candela, R ^a   Romano, P ^b  

^a UNIVERSITY OF PALERMO   (Italy)

^b CRES   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC POTENTIAL; EVOLUTIONARY ALGORITHMS; HIGH TEMPERATURE EFFECTS; OPTIMIZATION; PARTIAL DISCHARGES;

SPHERICAL VOIDS;

EPOXY RESINS;

EID: 0035415150     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.946711     Document Type: Article

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