Outsmarting waveguide losses in thin-film light-emitting diodes

Advanced Funtional Materials

Volumn 11, Issue 4, 2001, Pages 251-253

  Meerholz, Klaus ^a   Müller, David C ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROLUMINESCENCE; EXCITONS; FLUORESCENCE; OPTICAL WAVEGUIDES; PHOTONS; REFRACTIVE INDEX; THICKNESS MEASUREMENT; THIN FILMS;

FLUORESCENCE SPECTROSCOPY; INDIUM TIN OXIDE; WAVEGUIDE LOSSES;

LIGHT EMITTING DIODES;

EID: 0035414144     PISSN: 1616301X     EISSN: None     Source Type: Journal    
DOI: 10.1002/1616-3028(200108)11:4<251::AID-ADFM251>3.0.CO;2-Y     Document Type: Article

References (5)

1. N. C. Greenham, R. H. Friend, D. D. C. Bradley, Adv. Mater. 199-1, 6, 491.
2. R. Windisch, P. Heremans, A. Knobloch, P. Kiesel, G. H. Döhler, B. Dutta, G. Borghs, Appl. Phys. Lett. 1999, 74, 2256.
3. a) J. M. Lupton, B. J. Matterson, I. D. W. Samuel, M. J. Jory. W. L. Burns. Appl. Phys. Lett. 2000, 77, 3340.
4. b) B. J. Matterson. J. M. Lupton, A. F. Safonov, M. G. Salt, W. L. Burns, I. D. W. Samuel, Adv. Mater. 2001, 13, 123.
5. M. Boroditsky, T. F. Krauss, R. Coccioli, R. Vrijen, R. Bhat, E. Yablono-vitch, Appl. Phys. Lett. 1999, 75, 1036.