Effect of Composition and Crystallization Temperature on Microstructure of Y- and Er-SiAlON Iw-Phase Glass-Ceramics

Journal of the American Ceramic Society

Volumn 84, Issue 7, 2001, Pages 1601-1608

  MacLaren, Ian ^a,c   Falk, Lena K L ^a   Díaz, Aranzazu ^b   Hampshire, Stuart ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b UNIVERSITY OF LIMERICK   (Ireland)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; DOPING (ADDITIVES); ENERGY DISPERSIVE SPECTROSCOPY; ERBIUM; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; YTTRIUM;

DETECTABLE CRYSTALLINE PHASE; SILICON ALUMINUM OXYNITRIDE;

GLASS CERAMICS;

EID: 0035413175     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2001.tb00884.x     Document Type: Article

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