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Volumn 16, Issue 7, 2001, Pages 1960-1966
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Microstructural analysis of high-pressure compressed C60
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPACTION;
COMPUTER SIMULATION;
DEFORMATION;
HARDNESS;
HIGH RESOLUTION ELECTRON MICROSCOPY;
MICROSTRUCTURE;
POLYMERIZATION;
STACKING FAULTS;
VICKERS HARDNESS TESTING;
X RAY DIFFRACTION;
HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);
CARBON;
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EID: 0035410844
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.2001.0268 Document Type: Article |
Times cited : (10)
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References (15)
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