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Journal of Materials Research

Volumn 16, Issue 7, 2001, Pages 2103-2117

Microstructural characterization of rapidly solidified Al-Fe-Si, Al-V-Si, and Al-Fe-V-Si alloys

(2) Srivastava, A K a Ranganathan, S a

a NATIONAL PHYSICAL LABORATORY (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTALLINE MATERIALS; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRON MICROSCOPY; INTERMETALLICS; MICROSTRUCTURE; MORPHOLOGY; QUASICRYSTALS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE RINGS;

ALUMINUM ALLOYS;

EID: 0035410812 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2001.0287 Document Type: Article

Times cited : (23)

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