Adsorption-based porosimetry using capacitance measurements

Semiconductors

Volumn 35, Issue 7, 2001, Pages 816-820

  Tutov, E A ^a   Andryukov, A Yu ^a   Bormontov, E N ^a  

^a VORONEZH STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035402884     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1385718     Document Type: Article

References (20)

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