S-parameter broad-band measurements on-microstrip and fast extraction of the substrate intrinsic properties

IEEE Microwave and Wireless Components Letters

Volumn 11, Issue 7, 2001, Pages 305-307

  Hinojosa, J ^a  

^a TECHNICAL UNIVERSITY OF CARTAGENA   (Spain)

Author keywords

Broad band measurement; Microstrip; Permeability; Permittivity; Propagation; S parameters

Indexed keywords

ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC WAVE PROPAGATION; MAGNETIC PERMEABILITY; PERMITTIVITY; SCATTERING PARAMETERS;

MICROSTRIP CELLS;

MICROSTRIP LINES;

EID: 0035401690     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/7260.933779     Document Type: Article

References (14)

1. Automatic measurement of complex dielectric constant and permeability at microwave frequencies
2. Measurement of intrinsic properties of materials by time domain techniques
3. A microstrip device for the broad-band simultaneous measurement of complex permeability and permittivity
4. Two simple methods for the measurement of dielectric permittivity of low-loss microstrip substrates
5. Two methods for the measurement of substrate dielectric constant
6. Microstrip propagation on magnetic substrates
7. Accurate models for microstrip computed aided design
8. Accurate model for effective dielectric constant of microstrip with validity up to millimeter-wave frequencies
9. Noniterative stable transmission/reflection method for low-loss material complex permittivity determination
10. Losses of microstrip lines
11. Spurious radiation from microstrip