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Volumn 23, Issue 3-4, 2001, Pages 355-360
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The effect of annealing on the junction properties of CdTe/CdS cells with carbon contacts
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
DEGRADATION;
DIFFUSION;
IMPURITIES;
SHORT CIRCUIT CURRENTS;
TELLURIUM;
SPUTTERED CELLS;
CADMIUM;
ANNEALING;
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EID: 0035401280
PISSN: 09601481
EISSN: None
Source Type: Journal
DOI: 10.1016/S0960-1481(00)00123-3 Document Type: Article |
Times cited : (3)
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References (8)
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