메뉴 건너뛰기




Volumn 23, Issue 3-4, 2001, Pages 355-360

The effect of annealing on the junction properties of CdTe/CdS cells with carbon contacts

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; DEGRADATION; DIFFUSION; IMPURITIES; SHORT CIRCUIT CURRENTS; TELLURIUM;

EID: 0035401280     PISSN: 09601481     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0960-1481(00)00123-3     Document Type: Article
Times cited : (3)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.