Defect analysis in Czochralski grown Bi12SiO20 crystals

Journal of Crystal Growth

Volumn 229, Issue 1, 2001, Pages 233-237

  Kumaragurubaran, S ^a   Babu, S M ^a   Kitamura, K ^b   Takegawa, S ^b   Subramanian, C ^a  

^a ANNA UNIVERSITY   (India)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

A2. Czochralski method; B1. Oxides; B2. Photorefractive materials; B3. Solid state lasers

Indexed keywords

ABSORPTION; CRYSTAL GROWTH FROM MELT; DIELECTRIC PROPERTIES OF SOLIDS; DOPING (ADDITIVES); ELECTRIC HEATING; ETCHING; OXIDES; PHOTOCONDUCTING MATERIALS; PHOTOREFRACTIVE MATERIALS; SOLID STATE LASERS; TRANSPARENCY;

BISMUTH SILICON OXIDE;

BISMUTH COMPOUNDS;

EID: 0035399339     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01129-0     Document Type: Article

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